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    文件類型: .pdf
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    發布日期: 2023-09-11
  • 語言: ASP
  • 標簽: C#??

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Cracking Digital VLSI Verification Interview: Interview Success By 作者: Ramdas Mozhikunnath – Robin Garg ISBN-10 書號: 1519089864 ISBN-13 書號: 9781519089861 出版日期: 2016-03-13 pages 頁數: (228 ) How should I prepare for a Digital VLSI Verification Interview? What all topics do I need to know before I turn up for an interview? What all concepts do I need to brush up? What all resources do I have at my disposal for preparation? What does an Interviewer expect in an Interview? These are few questions almost all individuals ponder upon before an interview. If you have these questions in your mind, your search ends here as keeping these questions in their minds, authors have written this book that will act as a golden reference for candidates preparing for Digital VLSI Verification Interviews. Aim of this book is to enable the readers practice and grasp important concepts that are applicable to Digital VLSI Verification domain (and Interviews) through Question and Answer approach. To achieve this aim, authors have not restricted themselves just to the answer. While answering the questions in this book, authors have taken utmost care to explain underlying fundamentals and concepts. This book consists of 500+ questions covering wide range of topics that test fundamental concepts through problem statements (a common interview practice which the authors have seen over last several years). These questions and problem statements are spread across nine chapters and each chapter consists of questions to help readers brush-up, test, and hone fundamental concepts that form basis of Digital VLSI Verification. The scope of this book however, goes beyond technical concepts. Behavioral skills also form a critical part of working culture of any company. Hence, this book consists of a section that lists down behavioral interview questions as well. Topics covered in this book: Digital Logic Design (Number Systems, Gates, Combinational, Sequential Circuits, State Machines, and other Design prob

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